Products: Semiconductor Test Training CD-ROM:
Multimedia Computer-Based Training
Content: Example Screens

The Course Map

The Course Map is the starting point, which leads to Seven Chapters. You can view a brief example of each chapter by clicking on the information below.

Course Outline


Course Map
      

Chapter One -- Course Introduction

  Course Outline

  • Intro Screen
    The course introduction presents a general overview and explains various navigational buttons and operating procedures. It also explains the quizzes, scoring and the progress report. The system hardware requirements are defined here as well.
Intro Screen
 
  • Button Functions
    The Button Function screen explains the use of each button that will be used to navigate throughout the course. Notice the Lips Button at the top of the screen, many screens are introduced via the Lips button which explains the purpose of the exercise. There is a total of six individual screens in this chapter, each explains a unique aspect of the training software.
Buton Function Screen
 

Chapter Two -- Semiconductors and Test

 Course Outline

  • Intro
    Chapter two introduces the "Front End" and "Back End" manufacturing processes, namely fabrication and assembly/test. There is a quiz associated with each chapter, the results of each quiz appears in the Progress Report.
Semiconductors and Test
 
  • Semiconductor Manufacturing
    The Semiconductor Manufacturing sections presents an overview of the "Front End" processing required to manufacture silicon devices. It begins with an explanation of chip layout, then shows the process of pulling silicon ingots. Next the topics of wafers and dice are explained. Wafer test, assembly, packaging and final test are also explained. This section makes extensive use of pictures and movies.
Semiconductor Manufacturing
 
  • Silicon Ingots
    Many topics begin with a written explanation and then a movie is used to reinforce the information.
Silicon Ingots
 
  • Die Attach
    Movie Movies are used throughout Chapter 2. The film footage is licensed from the popular Silicon Run series. Movies help visualize and better understand the various steps and equipment involved in the manufacturing process.
Die Attach
 
  • Automatic Testing
    The second section of Chapter 2 explains ATE Test Systems and the peripheral equipment used in production testing. Various types of test systems, load-boards, probe-cards, wafer-probers, device-handlers and temperature forcing equipment are explained.
Automatic Testing
 
  • Wafer Prober
    In this picture an older style wafer prober is used to illustrate the internal workings of a probe machine. Fully enclosed (clean environment) probers are also included in this discussion.


Wafer Prober
 

 There are many more screens in this section.

 

Chapter Three -- Terminology of Test

 Course Outline

  • Intro
    Chapter Three defines the "Language" or "Terminology" of test. This information is presented as narration, interactive information and text based definitions.
Terminology of Test
 
  • Device Pins
    This screen defines the various types of pins (and their functions) as found on a digital device. It explains that each pin type will require specific tests, based on it's function.
Device Pins
 
  • Terminology
    Some things are best explained in written form. There are three screens of terms organized by their functions. A complete Glossary is also available via a Pop-Up Menu on the right mouse button
    .
Terminology
 

Chapter Four -- What's in the Test System?

  Course Outline

  • Intro
    Chapter Four presents an overview of a typical ATE Test System, and focuses on several key compontens of the system.
What's in the Test System?
 
  • Test System Overview
    This screen introduces the different sections of the tester and explains each function. This lesson is very interactive, first an animation is used to present an overview, then the student interacts with the screen to learn about specific areas and functions of the test system. We call this interactive screen a "Click Screen" because you can select, using the mouse, the subject that will be explained.
Test System Overview
 
  • The PMU
    In order to understand DC Parameter testing, it is essential to understand how the PMU functions. The details are explained here using animation's and a Click Screen.
The PMU
 
  • Pin Electronics Card
    In order to understand Functional Testing, it is essential to understand how the Pin Electronics functions. The details are explained here using animation's and a Click Screen.
Pin Electronics Card
 

Chapter Five -- Device Specifications

  Course Outline

  • Intro
    Every test program is based upon a device specification, we must first understand device specifications in order to make sense of the test program.


Device Specifications
 
  • What are Device Specifications?
    Device specifications can take several different forms, this section addresses these issues.
What are Device Specifications?
 
  • Logic Diagrams
    A Logic Diagram is included in most specifications. They often contain very useful information, it is necessary to be able to correctly read these diagrams. This is an animated Click Screen which is actually fun to use (and you will be learning in the process).
Logic Diagrams
 
  • Understanding a Data Sheet Specification
    Learning to understand the "DC Characteristics" section of the specification can be a very frustrating experience. We have attempted to make it interesting, less confusing and hopefully less frustrating, using an interactive screen.
Understanding a Data Sheet Specification
 

Chapter Six -- DC Parameters

  Course Outline

  • Intro
    Chapter Six explains test methodologies. It introduces the concepts of DC parameter testing and explains how the specification and test system hardware work together to insure that the device under test meets or exceeds it's specifications.
DC Parameters
 
  • Explaining a DC Test
    This format is used to explain each DC test. The buttons on the left select the various topics. The "RUN" button starts the animation, which displays in the main window. "WHY" opens a window which explains the purpose of each test. "Test Method" is a text version of the animation. The "Resistance" button opens a series of windows which explains the measurement path associated with the test. Trouble-shooting explains how to diagnose problems. "Key Points" summarizes the important issues.
Explaining a DC Test
 
  • Datalogs
    The datalog contains valuable information. An actual datalog for each test illistrates passing and failing conditions. The Lips are used to explain each measurement.
Datalogs
 
  • Actual Test Examples
    To help illistrate how the tests are implimented, each test has been programmed on the ATE Systems indicated above. An example of the actual test is display by pressing the appropriate button.
Actual Test Examples
 
  • The Quiz
    Each section of the training has an associated quiz. The results from the quiz are stored in an individual data base for each student.
The Quiz
 

  • The Virtual PMU
    The Virtual PMU is used to reinforce the students understanding of each test procedure. The VPMU must be correctly programmed, based on the device specification, the results of this activity are stored in the student database. Programming the VPMU is very similar to setting the test conditions on any popular test system.
The Virtual PMU
 

Chapter Seven - Troubleshooting

  Course Outline

  • Troubleshooting
    The final chapter addresses the issue of trouble-shooting. Although each DC test has an associated trouble-shooting section, we felt additional skills would be useful. The Introduction section points out the various items that COULD be causing a failure, then explains how to go about eliminating each suspect. A general approach to trouble-shooting is spelled out.
Troubleshooting
 
  • Learning to Listen for Clues
    There are six different problems that must be solved. Each problem is presented as a story containing important facts, but also leaving out important information. It is up to you to determine the steps that will be taken to solve each problem. All of the problems (and stories) are based on actual Test Floor experiences. Many engineers really enjoy working through these exercises!
Learning to Listen for Clues
 
  • Where Is the Problem?
    After listening to each story you will be armed with useful information. Based on that data you must decide upon what you believe is causing the problem (the DUT, Interface Hardware, Test System or Test Program). With each selection you will gain additional information, some useful, some not. Ultimately you will solve the problem. The most expedient method is explained after the problem is solved. You can then compare you selections with the proper (fastest) sequence. These exercises have proven to be very beneficial in helping engineers improve their trouble-shooting skill.
Where Is the Problem?

Progress Report

  Course Outline

A database stores the individual student information which is then displayed in the Progress Report. A record is kept as the student progresses through the course material. When the student completes the entire course and achieves a 75% passing result or better, a completion window appears on this screen and a completion code is issued. The Progress report can be printed or a coded text file can be produced and e-mailed to Soft Test. We will issue a "Certificate of Completion" upon receipt of proof of satisfactory completion. Many managers find the progress report a useful tool in evaluating the effectiveness of the training.

Progress Report
   

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