Soft Test Asia offers a complete reference book which details the concepts and techniques used in testing digital semiconductors. DC, AC and Functional tests are explained in detail and various test methods are discussed, along with the advantages and disadvantages of each method.

The "Hows and Whys" of each DC test are explained. A datalog example showing all possible pass and fail conditions and a trouble shooting guide outlines the steps needed to identify and solve problems related to each individual test.

Device specifications, device characterization, yield analysis, debug techniques, datalogs, shmoo plots and many more topics are explained in detail.

The book is designed to be a "Cook Book" for test and product engineers and it’s packed full of all the recipes you’ll need. The "Fundamentals of Digital Semiconductor Testing" condenses many years of test engineering experience into a single reference.
 

The "Fundamentals of Digital Semiconductor Testing" reference manual is designed to provide a complete reference for digital test engineers and is priced at only $100.00.