Click on topics to view details

• The Basics
• Overview of Semiconductors and ATE
• Introduction to Test
• Device Specifications
• Opens and Shorts - PMU Method
• Verifying DC Parameters
• Verifying Functional Parameters
• Testing AC Parameters
• Device Characterization
• Test Vector Development
• Test Program Development Issues
• Creating a Test Program
• Troubleshooting
• Qualifying and Documenting the Program
• CMOS Device Latch-up
• Principles of Scan Testing
• Glossary

The Basics

  Topics

• Scientific / Engineering Notation
  
• Voltage
  
• Current
  
• Resistance
  
• Using Ohm's Law to Test Device Specifications
  
• Digital Numbers
  
• Digital Logic

Overview of Semiconductors and ATE

  Topics

• ATE - Automated Test Equipment
  
• Semiconductor Technologies
  
• Digital and Analog Circuits
  
• Types of ATE Systems
  
• Tester Loadboards
  
• Wafer Probing
  
• Probe Cards
  
• Device Handlers
  
• Temperature Forcing Units

Introduction to Test

  Topics

• Basic Terms
  
• What is The Correct Way to Test?
  
• The Test System
  
• The PMU
  
• The Pin Electronics
  
• Basic Rules of Test Engineering
  
• Chapter Review/Quiz
  

Device Specifications

  Topics

• Basic Terms
  
• The Design Specification
  
• The Test Specification
  
• The Device Specification
  
• Test Conditions and Limits
  
• Parameters that Apply to Parametric Testing (DC)
  
• Parameters that Apply to Functional and AC Testing
  
• Logical Functions
  
• Reading Device Specifications
  
• 256 x 4 RAM Specifications
  
• Interprting the Device Specification
  
• Specifications and Test Conditions Work Exercise
  
• Chapter Review/Quiz

• Why Test for Opens and Shorts?
  
• Opens and Shorts Serial Static Method
  
• Chapter Review/Quiz

Verifying DC Parameters

  Topics

• Basic Terms
  
• Binning
  
• Program Flow
  
• Test Summary
  
• DC Tests and the Hidden Resistance
  
• Ohm's Law
  
• VOH/IOH
  
• VOL/IOL
  
• IDD Gross Current
  
• IDD Static Current
  
• IDDQ Current
  
• IDD Dynamic Current
  
• Input Currents (IIL/IIH)
  
• Resistive Inputs--Pull-ups and Pull-downs
  
• Output Fanout
  
• High Impedance Currents (IOZL/IOZH)
  
• Input Clamp (VI)
  
• Output Short Circuit Current (IOS)
  
• Chapter Review/Quiz
  

Verifying Functional Parameters

  Topics

• Basic Terms
  
• Functional Testing
  
• The Test Cycle
  
• Input Data
  
• Input Signal Formats
  
• Developing Input Signal Timings
  
• Output Data
  
• Testing Outputs
  
• Developing Output Signal Timing
  
• Vector Data
  
• Executing a Functional Test
  
• Functional Specifications
  
• Gross Functional Tests
  
• Equation Based Timing
  
• Testing a Device
  
• Sample Device Specification
  
• Specification Test Conditions for the Clocked Inverter
  
• Gross Functional Test Conditions for the Clocked Inverter
  
• Test Program Statements
  
• Standard Functional Tests
  
• Opens and Shorts - Functional Method
  
• VIL/VIH
  
• VOL/IOL VOH/IOH Functional Test
  
• Resistive Output Loading
  
• Functional Z-State -- High Impedance Testing
  
• Open Drain / Open Source Outputs
  
• Chapter Review/Quiz

Testing AC Parameters

  Topics

• AC Parametric Testing
  
• Read & Record
  
• Go-Nogo Testing
  
• Compromises
  
• Standard AC Parameters
  
• Setup Time
  
• Hold Time
  
• Propagation Delay Measurements
  
• Minimum Pulse Widths
  
• Maximum Frequency
  
• Output Enable Delay Time
  
• Output Disable Delay Time
  
• AC Specifications from 256 x 4 Static RAM Data Sheet
  
• Developing Functional Timing
  
• Write Cycle Timing
  
• Read Cycle Timing
  
• Chapter Review/Quiz

Device Characterization

  Topics

• Test Vectors and Characterization
  
• The Binary Search
  
• Binary Search Test Applications
  
• The Linear Search
  
• Common Characterization Parameters
  
• The Test System Datalogger
  
• Use of Test System Tools
  
• Shmoo Plots
  
• Threshold/Level Search
  
• Chapter Review/Quiz

Test Vector Development

  Topics

• Test Vectors
  
• Example Vector File
  
• Working with the Design Engineer
  
• Creating Vectors by Hand
  
• Tester Options (Memory Considerations)
  
• Test Vector Examples
  
• Simulation Data
  
• Simulation for Test
  
• Chapter Review/Quiz

Test Program Development Issues

  Topics

• What is the Primary Purpose of the Test Program?
  
• Other Considerations
  
• Initializing the Program
  
• Verifying the Test Setup
  
• Power-on Sequencing
  
• Power-off Sequencing
  
• Chapter Review/Quiz

Creating a Test Program

  Topics

• Developing the Test Plan from the Device Specification
  
• Designing the Test Hardware
  
• Writing the Test Program
  
• Loadboard Tests
  
• Tester Diagnostics
  
• Running the Program the First Time
  
• Verifying the Functional Test Setup
  
• A Brief Discussion on Test Vectors
  
• Chapter Review/Quiz

Troubleshooting

  Topics

• Where to Begin
  
• Example: IIL/IIH Test Failures
  
• Debug Tools
  
• Chapter Review/Quiz

Qualifying and Documenting the Program

  Topics

• Qualification
  
• Verify testing on handlers and probers
  
• Documenting the Test Program
  
• Chapter Review/Quiz

CMOS Device Latch-up

  Topics

• What is Latch-up?
  
• Latch-up Testing
  
• Test Patterns
  
• Test Procedure Summary
  
• Applying Test Stimulus

Principles of Scan Testing

  Topics

• What is Scan Testing?
  
• LSSD Technique
  
• Scan Test Equipment

Glossary

  Topics

• Answers to Review Questions
  
• Index
• Product Summary