The course is designed to explain the concepts and techniques used in testing digital semiconductors. Practical information is presented pertaining to test program development, debugging techniques and yield analysis. DC, AC and Functional tests are discussed in detail. An overview of the test requirements of the semiconductor industry is also presented.
 

The information presented will provide:

• A solid understanding of device specifications
• An understanding of how and why each test is performed
• An introduction to using test system tools
• Methods for improving the quality of test programs
• Increased productivity for test and product engineers
   

• Functional, DC, AC parametric tests and device specifications are explained in detail
• Test program generation and program flow
• Debug and trouble shooting techniques
• Understanding device characterization
• Qualifying and documenting test programs
• Converting CAD simulation data to test vectors
• Complete documentation is provided with the course
   

5 days