Training: Digital Test Knowledge Evaluation:
Take the Challenge!

Print this and answer the questions below. If you miss more than 3, you are a good candidate for the class.
  Match the terms with the definitions below
  A: Bi-directional
B: Static
C: VREF
D: IDD
E: IOH
F: Preconditioning
G: Dynamic
H: VIL
I: Binning 		J: Hold Time
K: Wafer Test
L: Setup time
M: Pin Electronics
N: Comparators
O: ICC
P: VOL
Q: IOL
R: VDDMAX
 

1) The minimum amount of time that data must be present after a reference signal reaches a certain voltage point.

2) A means of categorizing or sorting tested devices into their appropriate groupings.

3) Setting a device into the proper logic state so that a test may then be performed.

4) The parameter which defines the maximum acceptable current consumption of a TTL device.

5) The maximum voltage which may be applied to an input pin when applying a logic zero.

6) A type of device pin that functions as an input, an output and is also capable of achieving a high impedance state.

7) Circuitry located in the test head used to supply input signals to the device under test and to receive output signals from the device under test.

8) This term indicates that the device under test is actively changing logic states.

9) The reference voltage associated with the dynamic current loads, used to control the switching point of IOL and IOH currents.

10) The parameter which defines the minimum current that an output must source when driving a logic one.

  Select the correct answer for the questions below
  11) When Performing a functional opens and shorts test, the current is forced by:
 
  1. The PMU
  2. The programmable current loads
  3. Voltage is forced, not current
  4. None of the above
  12) When Performing the VOH test, the current forced during the test is:
 
  1. A positive current
  2. A negative current
  3. 1 or 2
  4. None of the abov
  13) The IIL/IIH test verifies:
 
  1. Input capacitance
  2. Input threshold levels
  3. Input resistance
  4. Internal device resistance
 

14) When the device specifications defines VDD as 5.0V +/- 5%, the value of VDDMIN is:

 
  1. 5.35 volts
  2. 5.00 volts
  3. 4.75 volts
  4. It depends on the technology (TTL or CMOS)
  15) The VIL/VIH specifications are verified by executing:
 
  1. A DC test
  2. A functional test
  3. An AC test
  4. No test, these parameters are guaranteed by design
 

16) Open drain outputs do not have the ability to:

 
  1. Drive a logic 0
  2. Drive a logic 1
  3. Source current
  4. 2 and 3
  17) Propagation measurements are only made on outputs:
 
  1. True
  2. False
  18) The output enable parameter verifies the transition time of an output changing from driving valid logic levels to a high impedance state.
 
  1. True
  2. False
  19) The majority of test vectors are currently being developed from simulation data.
 
  1. True
  2. False
  20) A linear search typically executes slower than a binary search
 
  1. True
  2. False

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