Training: Digital Test Technology:
 Course Outline

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Introduction to Test

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  • The Correct Way to Test
  • The DUT
  • The Test Program
  • The Test System
  • The Device Specification
  • Definitions of Terms
  • Basic Rules of Test Engineering
  • Sample Device Specification
  • The Items Needed to Test this Device
  • Programming Tester Resources
  • The Test Vector Pattern
  • Test Program Statements
  • Specification Test Conditions
  • Gross Functional Test Conditions
  • The Test System
  • Testing a Device
  • The PMU
  • Setting The PMU Clamps
  • The Pin Electronics
  • Test Specifications
  • The Design Specification
  • The Test Specification
  • The Device Specification
  • Test Conditions and Limits
  • Parameters that Apply to Parametric Testing (DC)
  • Parameters that Apply to Functional and AC Testing
  • Logical Functions
  • Reading Device Specifications
  • 256x4 Static Read/Write RAM Test Specifications
  • 256 X 4 RAM Specifications
  • Interpreting the Device Specification
  • Device Specifications and Test Conditions
  • Opens and Shorts Test
  • Opens and Shorts Serial Static Method
  • Opens and Shorts Functional Method
     

Verifying DC Parameters

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  • DC Tests and the Hidden Resistance
  • Ohm’s Law
  • IDD Gross Current
  • IDD Static Current
  • IDDQ Current
  • IDD Dynamic Current
  • VOL/IOL
  • VOH/IOH
  • Input Currents (IIL/IIH)
  • Resistive Inputs—Pull–ups and Pull–downs
  • Output Fanout
  • High Impedance Currents (IOZL/IOZH)
  • Input Clamp (VI)
  • Output Short Circuit Current (IOS)
     

Verifying Functional Parameters

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  • Functional Testing
  • The Test Cycle
  • Input Data
  • Output Data
  • Testing Outputs
  • Vector Data
  • Executing a Functional Test
  • Functional Specifications
  • Gross Functional Tests
  • Scalable Timing
  • VIL/VIH
  • VOL/IOL VOH/IOH Functional Test
  • Resistive Output Loading
  • Functional IOZ—High Impedance Testing
     

Testing AC Parameters

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  • AC Parametric Testing
  • Read & Record
  • Go–Nogo Testing
  • Compromises
  • AC Specifications from 256Kx4 Static RAM Data Sheet
  • Setup Time
  • Hold Time
  • Propagation Delay Measurements
  • Minimum Clock Widths
  • Maximum Frequency
  • Output Enable Time
  • Output Disable Time
  • Signal Formats
  • Developing Functional Timings
  • Developing Input Signal Timings
  • Defining Output Signal Timings
  • Output Loading for AC Tests
  • Write Cycle Timing
  • Read Cycle Timing
     

Device Characterization

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  • Test Vectors and Characterization
  • The Binary Search
  • Binary Search Test Applications
  • The Linear Search
  • Common Characterization Parameters
  • The Test System Datalogger
  • Use of Test System Tools
     

Test Vector Development

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  • Test Vectors
  • Example Vector File
  • Working with the Design Engineer
  • Creating Vectors by Hand
  • Tester Options (Memory Considerations)
  • Test Vector Examples
  • Simulation Data
  • Simulation for Test
     

Test Program Development Issues

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  • What is the Primary Purpose of the Test Program?
  • Other Considerations
  • Developing the Program Flow
  • Initializing the Program
  • Verifying the Test Setup
  • Power–on Sequencing
  • Binning
  • Test Summary
  • Power–off Sequencing

Creating a Test Program

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  • Developing the Test Plan from the Test Specification
  • Designing the Test Hardware
  • Writing the Test Program
  • Loadboard Tests
  • Tester Diagnostics
  • Running the Program the First Time
  • Verifying the Functional Test Setup
  • A Brief Discussion on Test Vectors
     

Debug and Troubleshooting

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  • Debugging a Test Problem
  • Debug Tools
  • Debug and Troubleshooting Review
 

Qualifying and Documenting the Test Program

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  • Qualification
  • Verify testing on handlers and probers
  • Documenting the Test Program
     

CMOS Device Latch–up

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  • What is latch–up?
  • Latch–up Testing
  • Test Patterns
  • Test Procedure Summary
  • Applying Test Stimulus
  • Principles of Scan Testing
  • What is Scan Testing?
  • LSSD Technique
  • Scan Test Equipment
     

Principles of Scan Testing

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  • What is Scan Testing?
  • LSSD Technique
  • Scan Test Equipment
     

A Review of Basic Electronics

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  • Scientific / Engineering Notation
  • Voltage, Current, Resistance
  • Ohm’s Law
  • Digital Numbers
  • Digital Logic
     

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