Top
- The Correct Way to Test
- The DUT
- The Test Program
- The Test System
- The Device Specification
- Definitions of Terms
- Basic Rules of Test Engineering
- Sample Device Specification
- The Items Needed to Test this Device
- Programming Tester Resources
- The Test Vector Pattern
- Test Program Statements
- Specification Test Conditions
- Gross Functional Test Conditions
- The Test System
- Testing a Device
- The PMU
- Setting The PMU Clamps
- The Pin Electronics
- Test Specifications
- The Design Specification
- The Test Specification
- The Device Specification
- Test Conditions and Limits
- Parameters that Apply to Parametric Testing (DC)
- Parameters that Apply to Functional and AC Testing
- Logical Functions
- Reading Device Specifications
- 256x4 Static Read/Write RAM Test Specifications
- 256 X 4 RAM Specifications
- Interpreting the Device Specification
- Device Specifications and Test Conditions
- Opens and Shorts Test
- Opens and Shorts Serial Static Method
- Opens
and Shorts Functional Method
Top
- DC Tests and the Hidden Resistance
- Ohm’s Law
- IDD Gross Current
- IDD Static Current
- IDDQ Current
- IDD Dynamic Current
- VOL/IOL
- VOH/IOH
- Input Currents (IIL/IIH)
- Resistive Inputs—Pull–ups and Pull–downs
- Output Fanout
- High Impedance Currents (IOZL/IOZH)
- Input Clamp (VI)
- Output
Short Circuit Current (IOS)
Verifying Functional Parameters
Top
- Functional Testing
- The Test Cycle
- Input Data
- Output Data
- Testing Outputs
- Vector Data
- Executing a Functional Test
- Functional Specifications
- Gross Functional Tests
- Scalable Timing
- VIL/VIH
- VOL/IOL VOH/IOH Functional Test
- Resistive Output Loading
- Functional
IOZ—High Impedance Testing
Top
- AC Parametric Testing
- Read & Record
- Go–Nogo Testing
- Compromises
- AC Specifications from 256Kx4 Static RAM Data Sheet
- Setup Time
- Hold Time
- Propagation Delay Measurements
- Minimum Clock Widths
- Maximum Frequency
- Output Enable Time
- Output Disable Time
- Signal Formats
- Developing Functional Timings
- Developing Input Signal Timings
- Defining Output Signal Timings
- Output Loading for AC Tests
- Write Cycle Timing
- Read Cycle
Timing
Top
- Test Vectors and Characterization
- The Binary Search
- Binary Search Test Applications
- The Linear Search
- Common Characterization Parameters
- The Test System Datalogger
- Use of
Test System Tools
Top
- Test Vectors
- Example Vector File
- Working with the Design Engineer
- Creating Vectors by Hand
- Tester Options (Memory Considerations)
- Test Vector Examples
- Simulation Data
- Simulation
for Test
Test Program Development Issues
Top
- What is the Primary Purpose of the Test Program?
- Other Considerations
- Developing the Program Flow
- Initializing the Program
- Verifying the Test Setup
- Power–on Sequencing
- Binning
- Test Summary
- Power–off
Sequencing
Top
- Developing the Test Plan from the Test Specification
- Designing the Test Hardware
- Writing the Test Program
- Loadboard Tests
- Tester Diagnostics
- Running the Program the First Time
- Verifying the Functional Test Setup
- A Brief
Discussion on Test Vectors
Top
- Debugging a Test Problem
- Debug Tools
- Debug and Troubleshooting Review
Qualifying and Documenting the Test Program
Top
- Qualification
- Verify testing on handlers and probers
- Documenting
the Test Program
Top
- What is latch–up?
- Latch–up Testing
- Test Patterns
- Test Procedure Summary
- Applying Test Stimulus
- Principles of Scan Testing
- What is Scan Testing?
- LSSD Technique
- Scan Test
Equipment
Top
- What is Scan Testing?
- LSSD Technique
- Scan Test
Equipment
Top
- Scientific / Engineering Notation
- Voltage, Current, Resistance
- Ohm’s Law
- Digital Numbers
- Digital
Logic
